Record Details

Title:
TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions
Affiliation(s):
EuXFEL staff, Other
Author group:
Management Board
Imprint:
Amsterdam, Elsevier, 2011
Journal Information:
High Energy Density Phys., 7, 336-342 (2011)
ISSN:
1878-0563
1574-1818
Related external records:
WOS: WOS:000298040400020
DOI: 10.1016/j.hedp.2011.06.008
Language(s):
English


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 Record created 2016-10-11, last modified 2019-02-01

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