Record Details

Title:
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements
Abstract:
We characterize the phase shift induced by reflection on a multilayer mirror in the extreme UV range (80-93 eV) using two techniques: one based on high order harmonic generation and attosecond metrology (reconstruction of attosecond beating by interference of two-photon transitions), and a second based on synchrotron radiation and measurements of standing waves (total electron yield). We find an excellent agreement between the results from the two measurements and a flat group delay shift (±40 as) over the main reflectivity peak of the mirror.
Imprint:
Washington, DC, Soc., 2011
Journal Information:
Opt. Lett., 36, 3386-3388 (2011)
ISSN:
1539-4794
0146-9592
Related external records:
View record in PubMed
DOI: 10.1364/OL.36.003386
WOS: WOS:000294667100028
Language(s):
English
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 Record created 2016-10-11, last modified 2018-12-19


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