Record Details

Title:
Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam
Affiliation(s):
EuXFEL staff
Author group:
Management Board
X-Ray Optics
Keyword(s):
Abstract:
We present results of a time-resolved pump-probe experiment where a Si sample was exposed to an intense 15 keV beam and its surface monitored by measuring the wavefront deformation of a reflected optical laser probe beam. By reconstructing and back propagating the wavefront, the deformed surface can be retrieved for each time step. The dynamics of the heat bump, build-up and relaxation, is followed with a spatial resolution in the nanometer range. The results are interpreted taking into account results of finite element method simulations. Due to its robustness and simplicity this method should find further developments at new x-ray light sources (FEL) or be used to gain understanding on thermo-dynamical behavior of highly excited materials.
Imprint:
Washington, DC, Soc., 2011
Journal Information:
Opt. Express, 19, 15516-15524 (2011)
ISSN:
1094-4087
Related external records:
Report number:
10.1364/OE.19.015516
Language(s):
English


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 Record created 2016-10-11, last modified 2019-01-30

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