Record Details

Title:
Self-terminating diffraction gates femtosecond x-ray nanocrystallography measurements
Affiliation(s):
EuXFEL staff
Author group:
Optical Lasers
Sample Environment
Advanced Electronics
Detector Development
Imprint:
London [u.a.], Nature Publ. Group, 2012
Journal Information:
Nat. Photonics, 6, 35-40 (2012)
ISSN:
1749-4893
1749-4885
Related external records:
WOS: WOS:000298416200013
DOI: 10.1038/nphoton.2011.297


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 Record created 2016-10-11, last modified 2019-02-08


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