Record Details

Title:
Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL
Affiliation(s):
EuXFEL guest, EuXFEL staff
Author group:
X-Ray Photon Diagnostics
Instrument SQS
Management Board
Keyword(s):
Topic:
Abstract:
The European X-ray Free Electron Laser (XFEL.EU) under construction will provide highly brilliant soft to hard X-ray (<280 eV - <20 keV) radiation with an intra-bunch train repetition rate of 4.5 MHz by employing the self-amplified spontaneous emission process. The resulting statistical fluctuations of important beam characteristics makes pulse-to-pulse diagnostics data of the photon beam a mandatory reference during user experiments. We present our concepts of analysing the photoemission from rare gases with a time-of-flight spectrometer for non-invasive, pulse-to-pulse measurements of the photon spectrum and polarization with a special emphasis on real-time processing with a low latency of ≤ 10−5 s.
Imprint:
Bellingham, Wash., SPIE, 2012
conference Information:
Proceedings of SPIE, 8504, 85040U (2012)
ISSN:
1996-756X
0277-786X
Related external records:
View record in PubMed
DOI: 10.1117/12.929805
WOS: WOS:000311837900018
Language(s):
English
Conference information:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, 2012-08-12 - 2012-08-12, USA


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 Record created 2016-10-11, last modified 2019-02-08


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