Record Details

Title:
Femtosecond X-ray Pulse Length Characterization at the LCLS Free Electron Laser
Affiliation(s):
EuXFEL guest, EuXFEL staff
Author group:
Instrument SPB/SFX
Management Board
Topic:
Abstract:
Two-color, single-shot time-of-flight electron spectroscopy of atomic neon was employed at the Linac Coherent Light Source (LCLS) to measure laser-assisted Auger decay in the x-ray regime. This x-ray-optical cross-correlation technique provides a straightforward, non-invasive and onlinemeans of determining the duration of femtosecond (>40 fs) x-ray pulses. In combination with a theoretical model of the process based on the softphoton approximation, we were able to obtain the LCLS pulse duration and to extract a mean value of the temporal jitter between the optical pulses from a synchronized Ti-sapphire laser and x-ray pulses from the LCLS. We find that the experimentally determined values are systematically smaller than the length of the electron bunches. Nominal electron pulse durations of 175 and 75 fs, as provided by the LCLS control system, yield x-ray pulse shapes of 120± 20 fs full-width at half-maximum (FWHM) and an upper limit of 40±20 fs FWHM, respectively. Simulations of the free-electron laser agree well with the experimental results.
Imprint:
Bad Honnef, Dt. Physikalische Ges., 2011
Journal Information:
New J. Phys., 13, 093024 (2011)
ISSN:
0398-9836
1144-0546
1369-9261
Related external records:
DOI: 10.1088/1367-2630/13/9/093024
WOS: WOS:000296645400001
Language(s):
English


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 Record created 2016-10-11, last modified 2019-02-08

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