Investigation of X-ray induced radiation damage at the Si-SiO interface of silicon sensors for the European XFEL
Zhang, Jiaguo Corresponding author; Fretwurst, E.; Klanner, R.; Pintilie, I.; Schwandt, J.; Turcato, M.
2012
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Title
Investigation of X-ray induced radiation damage at the Si-SiO interface of silicon sensors for the European XFEL
Author
Zhang, Jiaguo Corresponding author
Fretwurst, E.
Klanner, R.
Pintilie, I.
Schwandt, J.
Turcato, M.
Fretwurst, E.
Klanner, R.
Pintilie, I.
Schwandt, J.
Turcato, M.
Affiliation
EuXFEL staff
Author Group
Detector Development
Topic
Imprint
London, 2012, Inst. of Physics
Date
2012
Publication Information
J. Instrum., 7, C12012 (2012)
ISSN
1748-0221
Related external records
DOI: https://doi.org/10.1088/1748-0221/7/12/C12012
WOS: WOS:000312962500012
WOS: WOS:000312962500012
Related proposal number
POF II
Content Type
Articles
Funding Information
XFEL In-house research / external facilities (POF2-54G17)
Record Appears in
Groups > Detectors and data acquisition > Detector Development
Topics > External experiments
Types > Articles
Years > 2012
Topics > External experiments
Types > Articles
Years > 2012