Record Details

Title:
Investigation of X-ray induced radiation damage at the Si-SiO interface of silicon sensors for the European XFEL
Affiliation(s):
EuXFEL staff
Author group:
Detector Development
Topic:
Imprint:
London, Inst. of Physics, 2012
Journal Information:
J. Instrum., 7, C12012 (2012)
ISSN:
1748-0221
Related external records:
DOI: 10.1088/1748-0221/7/12/C12012
WOS: WOS:000312962500012


Export


 Record created 2016-10-11, last modified 2019-01-30

Restricted:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)