X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

Heighway, P. G.; Peake, D. J.; Stevens, T.; Wark, J. S.; Albertazzi, B.; Ali, S. J.; Antonelli, L.; Armstrong, M. R.; Baehtz, Carsten; Ball, O. B.; Banerjee, S.; Belonoshko, A. B.; Bolme, C. A.; Bouffetier, V.; Briggs, R.; Buakor, K.; Butcher, T.; Di Dio Cafiso, S.; Cerantola, V.; Chantel, J.; Di Cicco, A.; Coleman, A. L.; Collier, J.; Collins, G.; Comley, A. J.; Coppari, F.; Cowan, T. E.; Cristoforetti, G.; Cynn, H.; Descamps, A.; Dorchies, F.; Duff, M. J.; Dwivedi, A.; Edwards, C.; Eggert, J. H.; Errandonea, D.; Fiquet, G.; Galtier, E.; Laso Garcia, A.; Ginestet, H.; Gizzi, L.; Gleason, A.; Göde, S.; Gonzalez, J. M.; Gorman, M. G.; Harmand, M.; Hartley, N. J.; Hernandez-Gomez, C.; Higginbotham, A.; Höppner, H.; Humphries, O. S.; Husband, R. J.; Hutchinson, T. M.; Hwang, H.; Keen, D. A.; Kim, J.; Koester, P.; Konôpková, Z.; Kraus, D.; Krygier, A.; Labate, L.; Lazicki, A. E.; Lee, Y.; Liermann, H.-P.; Mason, P.; Masruri, M.; Massani, B.; McBride, E. E.; McGuire, C.; McHardy, J. D.; McGonegle, D.; McWilliams, R. S.; Merkel, S.; Morard, G.; Nagler, B.; Nakatsutsumi, M.; Nguyen-Cong, K.; Norton, A.-M.; Oleynik, I. I.; Otzen, C.; Ozaki, N.; Pandolfi, S.; Pelka, A.; Pereira, K. A.; Phillips, J. P.; Prescher, C.; Preston, T.; Randolph, L.; Ranjan, D.; Ravasio, A.; Rips, J.; Santamaria-Perez, D.; Savage, D. J.; Schölmerich, M.; Schwinkendorf, J.-P.; Singh, S.; Smith, J.; Smith, R. F.; Sollier, A.; Spear, J.; Spindloe, C.; Stevenson, M.; Strohm, C.; Suer, T.-A.; Tang, M.; Toncian, M.; Toncian, T.; Tracy, S. J.; Trapananti, A.; Tschentscher, T.; Tyldesley, M.; Vennari, C. E.; Vinci, T.; Vogel, S. C.; Volz, T. J.; Vorberger, J.; Willman, J. T.; Wollenweber, L.; Zastrau, U.; Brambrink, E.; Appel, K.; McMahon, M. I.

X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

Heighway, P. G.; Peake, D. J.; Stevens, T.; Wark, J. S.; Albertazzi, B.; Ali, S. J.; Antonelli, L.; Armstrong, M. R.; Baehtz, Carsten; Ball, O. B.; Banerjee, S.; Belonoshko, A. B.; Bolme, C. A.; Bouffetier, V.; Briggs, R.; Buakor, K.; Butcher, T.; Di Dio Cafiso, S.; Cerantola, V.; Chantel, J.; Di Cicco, A.; Coleman, A. L.; Collier, J.; Collins, G.; Comley, A. J.; Coppari, F.; Cowan, T. E.; Cristoforetti, G.; Cynn, H.; Descamps, A.; Dorchies, F.; Duff, M. J.; Dwivedi, A.; Edwards, C.; Eggert, J. H.; Errandonea, D.; Fiquet, G.; Galtier, E.; Laso Garcia, A.; Ginestet, H.; Gizzi, L.; Gleason, A.; Göde, S.; Gonzalez, J. M.; Gorman, M. G.; Harmand, M.; Hartley, N. J.; Hernandez-Gomez, C.; Higginbotham, A.; Höppner, H.; Humphries, O. S.; Husband, R. J.; Hutchinson, T. M.; Hwang, H.; Keen, D. A.; Kim, J.; Koester, P.; Konôpková, Z.; Kraus, D.; Krygier, A.; Labate, L.; Lazicki, A. E.; Lee, Y.; Liermann, H.-P.; Mason, P.; Masruri, M.; Massani, B.; McBride, E. E.; McGuire, C.; McHardy, J. D.; McGonegle, D.; McWilliams, R. S.; Merkel, S.; Morard, G.; Nagler, B.; Nakatsutsumi, M.; Nguyen-Cong, K.; Norton, A.-M.; Oleynik, I. I.; Otzen, C.; Ozaki, N.; Pandolfi, S.; Pelka, A.; Pereira, K. A.; Phillips, J. P.; Prescher, C.; Preston, T.; Randolph, L.; Ranjan, D.; Ravasio, A.; Rips, J.; Santamaria-Perez, D.; Savage, D. J.; Schölmerich, M.; Schwinkendorf, J.-P.; Singh, S.; Smith, J.; Smith, R. F.; Sollier, A.; Spear, J.; Spindloe, C.; Stevenson, M.; Strohm, C.; Suer, T.-A.; Tang, M.; Toncian, M.; Toncian, T.; Tracy, S. J.; Trapananti, A.; Tschentscher, T.; Tyldesley, M.; Vennari, C. E.; Vinci, T.; Vogel, S. C.; Volz, T. J.; Vorberger, J.; Willman, J. T.; Wollenweber, L.; Zastrau, U.; Brambrink, E.; Appel, K.; McMahon, M. I.

2025

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Abstract

We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.