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Abstract
The optimal exploitation of advanced photon sources, such as X-ray free-electron lasers (XFELs), depends on the characterization quality of the produced X-ray pulses. An accurate characterization of temporal properties is particularly challenging, yet extremely important given the recent emphasis on the production of ultra-short pulses in this short wavelength regime. In this work, we present a methodology for retrieving temporal properties of attosecond XFEL pulses using angular streaking data. These are obtained utilizing a photo-electron analyzer setup composed of sixteen electron time-of-flight spectrometers. Their output is calibrated and fed to a non-linear phase retrieval algorithm, which yields the time-dependent electric field of the measured X-ray pulses. Furthermore, in this paper we highlight the effect of spectral resolution on the quality of reconstructed temporal properties.