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Abstract
The XAFS-DET work package of the European LEAPS-INNOV project is developing high-purity Germanium detectors for synchrotron applications requiring spectroscopic-grade response. The detectors integrate three key features: (1) newly designed monolithic Germanium sensors optimized to mitigate charge-sharing events, (2) an improved cooling and mechanical design structure supported by thermal simulations, and (3) complete electronic chain featuring a low-noise CMOS technology based preamplifier, enabling high X-ray count rate capability over a broad energy range (5–100 keV). This paper discusses the first integration and characterization of one of the two multi-element Ge detectors at the European Synchrotron Radiation Facility (ESRF). The integration phase included validating high-throughput front-end electronics, integrating them with the Ge sensor, and operating them at liquid nitrogen temperature, in addition to the experimental characterization, which consists of electronics noise study and spectroscopic performance evaluation.