Characterization of a Single Module of DEPFET X-Ray Camera at the European XFEL
Dourki, Ibrahym; Lomidze, David; Danilevski, Cyril; Guazzoni, C. ; Ghisetti, M. ; Le Guyader, Loic; Aschauer, S. ; Ovcharenko, Yevheniy; Usenko, Sergey; Strüder, L. ; Hansen, K. ; Maffessanti, S.; Engelke, Jan; De Fanis, Alberto; Montaño, Jacobo; Dold, Simon; Castoldi, A. ; Meyer, Michael; Turcato, Monica; Porro, Matteo
2024
Files
Details
Title
Characterization of a Single Module of DEPFET X-Ray Camera at the European XFEL
Author
Affiliation
EuXFEL staff, EuXFEL guest, Other
Author Group
Detector Operations
Instrument SCS
Instrument SQS
Instrument SCS
Instrument SQS
Scientific Area
Imprint
2024
Date
2024
Content Type
Posters
Language
English
Event/Conference
European XFEL Users' Meeting 2024, Hamburg, 2024-01-22, 2024-01-29, UM2024
Record Appears in