Damage studies of multilayer optics for XUV free electron lasers
Louis E.; Khorsand A.R.; Sobierajski R.; Van Hattum E.D.; Jurek M.; Klinger D.; Pelka J.B.; Juha L.; Chalupsky J.; Cihelka J.; Hajkova V.; Jastrow U.; Toleikis S.; Wabnitz H.; Tiedtke K.; Gaudin J.; Gullikson E.M.; Bijkerk F.
2009

Details

Title
Damage studies of multilayer optics for XUV free electron lasers
Author
Louis E.
Khorsand A.R.
Sobierajski R.
Van Hattum E.D.
Jurek M.
Klinger D.
Pelka J.B.
Juha L.
Chalupsky J.
Cihelka J.
Hajkova V.
Jastrow U.
Toleikis S.
Wabnitz H.
Tiedtke K.
Gaudin J.
Gullikson E.M.
Bijkerk F.
Affiliation
EuXFEL staff
Imprint
2009
Date
2009
Publication Information
Proceedings of SPIE - The International Society for Optical Engineering (7361), 73610I (2009)
Content Type
Proceedings
Event/Conference
Damage to VUV, EUV, and X-Ray Optics II, Prague, 2009-04-21, 2009-04-23
Record Appears in
Types > Proceedings
Years > 2009

Statistics

from
to
Export