Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals
2012
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Details
Title
Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals
Affiliation
EuXFEL staff
Imprint
2012
Date
2012
Publication Information
Proceedings of SPIE - The International Society for Optical Engineering (8504), 85040H (2012)
Content Type
Proceedings
Event/Conference
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, CA, 2012-08-13, 2012-08-16
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