Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals
2012
Details
Title
Modeling of XFEL induced ionization and atomic displacement in protein nanocrystals
Affiliation
EuXFEL staff
Imprint
2012
Date
2012
Publication Information
Proceedings of SPIE - The International Society for Optical Engineering (8504), 85040H (2012)
Content Type
Proceedings
Event/Conference
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, San Diego, CA, 2012-08-13, 2012-08-16
Record Appears in