Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL

Rivas, Daniel; Grychtol, Patrik; Baumann, Thomas; Boll, Rebecca; Erk, Benjamin; De Fanis, Alberto; Grünert, Jan; Ilchen, Markus; Liu, Jia; Mazza, Tommaso; Montaño, Jacobo; Music, Valerija; Ovcharenko, Yevheniy; Rennhack, Nils; Rouzée, Arnaud; Rörig, Aljoscha; Schmidt, Philipp; Usenko, Sergey; Wagner, Rene; Ziolkowski, Pawel; Meyer, Michael

2020

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Abstract

We present the first pump/probe measurements performed at the SQS instrument of the European XFEL. We obtain the first characterization of the femtosecond temporal resolution and show the feasibility for the investigation of ultrafast dynamics.

Details

Title

Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL

Affiliation

EuXFEL staff, Other, EuXFEL guest

Author Group

Instrument SQS
Instrument SXP
X-Ray Photon Diagnostics
Data Analysis
Undulator Systems

Keywords

Laser amplifiers; Laser beams; Multiphoton ionization; Optical systems; Photon counting; X-ray lasers

Topic

SQS experiment

Scientific Area

Atoms, molecules, clusters, and gas-phase chemistry

Imprint

Optica Publishing Group (formerly OSA), 2020

Date

2020

Publication Information

Optics InfoBase Conference Papers, M4B.35 (2020)

ISBN

978-1-943580-83-5

Related external records

DOI: https://doi.org/10.1364/UP.2020.M4B.35

Content Type

Proceedings

Language

English

Event/Conference

22nd International Conference on Ultrafast Phenomena, UP 2020, Washington, 2020-11-16, 2020-11-19

External Website

https://opg.optica.org/abstract.cfm?uri=up-2020-M4B.35

Record Appears in

Groups > Detectors and data acquisition > Data Analysis
Groups > Photon beam systems > X-Ray Photon Diagnostics
Groups > Photon beam systems > Undulator Systems
Topics > XFEL.EU experiments
Types > Proceedings
Beamlines > SASE3
Instruments > SQS
Years > 2020

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