Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL
Rivas, Daniel; Grychtol, Patrik; Baumann, Thomas; Boll, Rebecca; Erk, Benjamin; De Fanis, Alberto; Grünert, Jan; Ilchen, Markus; Liu, Jia; Mazza, Tommaso; Montaño, Jacobo; Music, Valerija; Ovcharenko, Yevheniy; Rennhack, Nils; Rouzée, Arnaud; Rörig, Aljoscha; Schmidt, Philipp; Usenko, Sergey; Wagner, Rene; Ziolkowski, Pawel; Meyer, Michael
2020
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Cite
Citation
Abstract
We present the first pump/probe measurements performed at the SQS instrument of the European XFEL. We obtain the first characterization of the femtosecond temporal resolution and show the feasibility for the investigation of ultrafast dynamics.
Details
Title
Ultrafast ion- and electron-spectroscopy with soft X-rays at the European XFEL
Author
Rivas, Daniel
Grychtol, Patrik
Baumann, Thomas
Boll, Rebecca
Erk, Benjamin
De Fanis, Alberto
Grünert, Jan
Ilchen, Markus
Liu, Jia
Mazza, Tommaso
Montaño, Jacobo
Music, Valerija
Ovcharenko, Yevheniy
Rennhack, Nils
Rouzée, Arnaud
Rörig, Aljoscha
Schmidt, Philipp
Usenko, Sergey
Wagner, Rene
Ziolkowski, Pawel
Meyer, Michael
Grychtol, Patrik
Baumann, Thomas
Boll, Rebecca
Erk, Benjamin
De Fanis, Alberto
Grünert, Jan
Ilchen, Markus
Liu, Jia
Mazza, Tommaso
Montaño, Jacobo
Music, Valerija
Ovcharenko, Yevheniy
Rennhack, Nils
Rouzée, Arnaud
Rörig, Aljoscha
Schmidt, Philipp
Usenko, Sergey
Wagner, Rene
Ziolkowski, Pawel
Meyer, Michael
Affiliation
EuXFEL staff, Other, EuXFEL guest
Author Group
Instrument SQS
Instrument SXP
X-Ray Photon Diagnostics
Data Analysis
Undulator Systems
Instrument SXP
X-Ray Photon Diagnostics
Data Analysis
Undulator Systems
Keywords
Topic
Scientific Area
Imprint
Optica Publishing Group (formerly OSA), 2020
Date
2020
Publication Information
Optics InfoBase Conference Papers, M4B.35 (2020)
ISBN
978-1-943580-83-5
Related external records
Content Type
Proceedings
Language
English
Event/Conference
22nd International Conference on Ultrafast Phenomena, UP 2020, Washington, 2020-11-16, 2020-11-19
External Website
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