X-ray absorption fine-structure (XAFS) spectroscopy is a well-established technique capable to extract information on the electronic and lattice structure of a material with atomic resolution. Analysis of the XAFS spectrum in the near-edge region (XANES) provides information about the electronic configuration. Structural information is extracted from the extended XAFS (EXAFS) spectrum, consisting of several hundreds of eV above the absorption edge. Connecting the spectroscopic capabilities of XAFS technique to high temporal resolution would give the possibility to follow electronic and lattice dynamics in real time.