Record Details

Title:
SASE Characteristics from Baseline European XFEL Undulators in the Tapering Regime
Affiliation(s):
EuXFEL staff
Author group:
Simulation of Photon Fields
Topic:
Abstract:
The output SASE characteristics of the baseline European XFEL, recently used in the TDRs of scientific instruments and X-ray optics, have been previously optimized assuming uniform undulators without considering the potential of undulator tapering in the SASE regime. Here we demonstrate that the performance of European XFEL sources can be significantly improved without additional hardware. The procedure consists in the optimization of the undulator gap configuration for each X-ray beamline. Here we provide a comprehensive description of the X-ray photon beam properties as a function of wavelength and bunch charge. Based on nominal parameters for the electron beam, we demonstrate that undulator tapering allows one to achieve up to a tenfold increase in peak power and photon spectral density in the conventional SASE regime.
Imprint:
2014
conference Information:
(2014)
ISBN:
978-3-95450-133-5
Language(s):
English
Conference information:
Free Electron Laser Conference 2014, FEL2014, Basel, 2014-08-25 - 2014-08-29, Switzerland


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 Record created 2016-10-11, last modified 2019-01-30

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