Here presented are the results of the user assisted commissioning of the high-resolution inelastic X-ray scattering setup at the High Energy Density (HED) scientific instrument at the European XFEL. Free-electron laser facilities enable new applications for transient phenomena like the response of dynamical excitations. One key application in the high-energy density regime is the study of the dynamic structure factor as it allows to retrieve electron and ion temperatures in warm and hot dense matter on a short time scale. High-resolution inelastic X-ray Scattering (hrIXS) at a self-seeded XFEL has proven to be a suitable method to measure dynamic ion features of both crystalline and noncrystalline materials. In particular, this allows a direct measurement of the ion temperature via detailed balance of the Stokes/anti-Stokes lines, which has been demonstrated on this setup for single crystal diamond. HrIXS is realized at HED for 7.494 keV by a combination of the generic beamline Si(111) monochromator and a high-resolution Si(533) monochromator specially installed for this purpose. They are combined with a set of diced crystal analysers in the HED IC1 vacuum chamber.