Files
Abstract
Development and characterization of an angle-resolved photo-electron spectrometer, based on the electron Time-of-Flight (TOF) concept, designed for hard X-ray photon diagnostics at the European X-ray Free-Electron Laser (EuXFEL) is described. The objective with the instrument is to provide beamline users and operators with pulse resolved, non-invasive spectral distribution diagnostics, which in the hard X-ray regime is a challenge due to the poor cross-section and often very high kinetic energy of photo electrons for the available target gases. In this contribution, we describe tests that were made at beamline P09, PETRA III at DESY.