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Abstract

We report on a new dynamic-XPS end-station for real-time investigations of advanced materials. The end-station is based on a new Argus hemispherical electron spectrometer with high speed detection system. In combination with the high brilliance XUV beamline P04 at PETRA III it provides users at PETRA III a unique tool for fast (down to 0.1 s/spectrum) and detailed investigations compared to existing XPS devices at other beamlines.

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