An X-ray free-electron laser oscillator (XFELO) is a fourth generation X-ray source promising radiation with full three dimensional coherence, nearly constant pulse to pulse stability and more than an order of magnitude higher peak brilliance compared to SASE FELs. Proposed by Kim et al. in 2008 [1] an XFELO follows the concept of circulating the light in an optical cavity - as known from FEL oscillators in longer wavelength regimes - but uses Bragg reflecting crystals instead of classical mirrors. With the new European X-ray Free-Electron Laser (XFEL) facility recently gone into operation, the realization of an XFELO with radiation in the Angstrom regime seems feasible. Though, the high thermal load of the radiation on the cavity crystals, the high sensibility of the Bragg-reflection on reflection angle and crystal temperature as well as the very demanding tolerances of the at least 60 m long optical resonator path pose challenges which need to be considered. In this work these problems shall be summarized and results regarding the possible integration of an XFELO at the European XFEL facility will be presented.