Record Details

Title:
Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources
Affiliation(s):
EuXFEL staff, EuXFEL guest
Author group:
Instrument SPB/SFX
Keyword(s):
Topic:
Scientific area:
Abstract:
Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.
Imprint:
OSA, 2019
Journal Information:
Optica, 6 (9), 1106 (2019)
Related external records:
Language(s):
English


Export


 Record created 2019-08-23, last modified 2019-08-23

Fulltext:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)