000001943 001__ 1943
000001943 005__ 20190507115727.0
000001943 02470 $$2DOI$$a10.1107/S1600577519003382
000001943 037__ $$aARTICLE-2019-063
000001943 041__ $$aeng
000001943 245__ $$aCharacterizing transmissive diamond gratings as beam splitters for the hard X-ray single-shot spectrometer of the European XFEL
000001943 260__ $$c2019
000001943 269__ $$a2019
000001943 336__ $$aArticles
000001943 520__ $$aThe European X-ray Free Electron Laser (EuXFEL) offers intense, coherent femtosecond pulses, resulting in characteristic peak brilliance values a billion times higher than that of conventional synchrotron facilities. Such pulses result in extreme peak radiation levels of the order of terawatts $cm^{−2}$ for any optical component in the beam and can exceed the ablation threshold of many materials. Diamond is considered the optimal material for such applications due to its high thermal conductivity (2052 W $mK^{−1}$ at 300 K) and low absorption for hard X-rays. Grating structures were fabricated on free-standing CVD diamond of 10 µm thickness with 500 µm silicon substrate support. The grating structures were produced by electron-beam lithography at the Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, Switzerland. The grating lines were etched to a depth of 1.2 µm, resulting in an aspect ratio of 16. The characterization measurements with X-rays were performed on transmissive diamond gratings of 150 nm pitch at the P10 beamline of PETRA III, DESY. In this paper, the gratings are briefly described, and a measured diffraction efficiency of 0.75% at 6 keV in the first-order diffraction is shown; the variation of the diffraction efficiency across the grating surface is presented.
000001943 546__ $$aEnglish
000001943 6531_ $$aFEL physics
000001943 6531_ $$ainstrumentation
000001943 655__ $$aX-ray scattering, X-ray optics, and instrumentation techniques
000001943 6531_ $$aliquid jets
000001943 6531_ $$aphoton diagnostics
000001943 6531_ $$asample delivery
000001943 690__ $$aEuXFEL facility
000001943 7001_ $$aKujala, Naresh
000001943 7001_ $$aMakita, Mikako
000001943 7001_ $$aLiu, Jia
000001943 7001_ $$aZozulya, Alexey
000001943 7001_ $$aSprung, Michael
000001943 7001_ $$aDavid, Christian
000001943 7001_ $$aGrünert, Jan
000001943 770__ $$x1600-5775
000001943 773__ $$j26$$k3$$pJ. Synchrotron Rad.$$q708-713$$tJournal of Synchrotron Radiation
000001943 790__ $$aEuXFEL staff
000001943 790__ $$aOther
000001943 85641 $$uhttp://scripts.iucr.org/cgi-bin/paper?S1600577519003382
000001943 8560_ $$fkurt.ament@xfel.eu
000001943 8564_ $$uhttps://xfel.tind.io/record/1943/files/xn5014.pdf$$s979652
000001943 900__ $$aX-Ray Photon Diagnostics
000001943 980__ $$aARTICLE