000001664 001__ 1664
000001664 005__ 20190130104946.0
000001664 02470 $$a10.1063/1.5031907$$2doi
000001664 037__ $$aARTICLE-2018-050
000001664 041__ $$aeng
000001664 245__ $$aSimultaneous 8.2 keV phase-contrast imaging and 24.6 keV X-ray diffraction from shock-compressed matter at the LCLS
000001664 260__ $$bAIP Publishing$$c2018$$hUSA
000001664 269__ $$a2018
000001664 336__ $$aArticles
000001664 520__ $$aIn this work, we demonstrate simultaneous phase-contrast imaging (PCI) and X-ray diffraction from shock compressed matter at the Matter in Extreme In this work, we demonstrate simultaneous phase-contrast imaging (PCI) and X-ray diffraction from shock compressed matter at the Matter in Extreme Conditions endstation, at the Linac Coherent Light Source (LCLS). We utilize the chromaticity from compound refractive X-ray lenses to focus the 24.6 keV 3rd order undulator harmonic of the LCLS to a spot size of 5 μm on target to perform X-ray diffraction. Simultaneous PCI from the 8.2 keV fundamental X-ray beam is used to visualize and measure the transient properties of the shock wave over a 500 μm field of view. Furthermore, we demonstrate the ability to extend the reciprocal space measurements by $5 Å{^−}{^1}$, relative to the fundamental X-ray energy, by utilizing X-ray diffraction from the 3rd harmonic of the LCLS.
000001664 546__ $$aEnglish
000001664 6531_ $$aGeometrical optics
000001664 6531_ $$aShock waves
000001664 6531_ $$aLasers
000001664 6531_ $$aOptical metrology
000001664 6531_ $$aPhase contrast microscopy
000001664 6531_ $$aX-ray diffraction
000001664 655__ $$aMatter under extreme conditions, warm dense matter, and plasmas
000001664 655__ $$aX-ray scattering, X-ray opics, and instrumentation techniques
000001664 655__ $$aHard condensed matter, structure, and dynamics
000001664 690__ $$aExternal experiment
000001664 690__ $$aTheory and simulation
000001664 7001_ $$aSeiboth, F.
000001664 7001_ $$aFletcher, L. B.
000001664 7001_ $$aMcGonegle, D.
000001664 7001_ $$aAnzellini, S.
000001664 7001_ $$aDresselhaus-Cooper, L. E.
000001664 7001_ $$aFrost, M.
000001664 7001_ $$aGaltier, E.
000001664 7001_ $$01303$$aGoede, S.
000001664 7001_ $$aHarmand, M.
000001664 7001_ $$aLee, H. J.
000001664 7001_ $$aLevitan, A. L.
000001664 7001_ $$aMiyanishi, K.
000001664 7001_ $$aNagler, B.
000001664 7001_ $$aNam, I.
000001664 7001_ $$aOzaki, N.
000001664 7001_ $$aRödel, M.
000001664 7001_ $$aSchropp, A.
000001664 7001_ $$aSpindloe, C.
000001664 7001_ $$aSun, P.
000001664 7001_ $$aWark, J. S.
000001664 7001_ $$aHastings, J.
000001664 7001_ $$aGlenzer, S. H.
000001664 7001_ $$aMcBride, E. E.$$01290
000001664 773__ $$j112$$k112$$pAppl. Phys. Lett.$$q221907$$tApplied Physics Letters
000001664 790__ $$aEuXFEL staff
000001664 790__ $$aOther
000001664 85641 $$uhttps://aip.scitation.org/doi/abs/10.1063/1.5031907
000001664 8560_ $$flaura.outterside@xfel.eu
000001664 8564_ $$uhttps://xfel.tind.io/record/1664/files/Appl%20Phys%20Lett%20112.pdf$$s1385408
000001664 900__ $$aInstrument HED
000001664 980__ $$aARTICLE