Self-terminating diffraction gates femtosecond x-ray nanocrystallography measurements
Barty, A.; Caleman, C.; Aquila, A.; Timneanu, N.; Lomb, L.; White, T. A.; Andreasson, J.; Arnlund, D.; Bajt, S.; Barends, T. R. M.; Barthelmess, M.; Bogan, M. J.; Bostedt, C.; Bozek, J. D.; Coffee, R.; Coppola, N.; Davidsson, J.; DePonte, Daniel; Doak, R. B.; Ekeberg, T.; Elser, V.; Epp, S. W.; Erk, B.; Fleckenstein, H.; Foucar, L.; Fromme, P.; Graafsma, H.; Gumprecht, L.; Hajdu, J.; Hampton, C. Y.; Hartmann, R.; Hartmann, A.; Hauser, G.; Hirsemann, H.; Holl, P.; Hunter, M. S.; Johansson, L.; Kassemeyer, S.; Kimmel, N.; Kirian, R. A.; Liang, M.; Maia, F. R. N. C.; Malmerberg, E.; Marchesini, S.; Martin, A. V.; Nass, K.; Neutze, R.; Reich, C.; Rolles, D.; Rudek, B.; Rudenko, A.; Scott, H.; Schlichting, I.; Schulz, Joachim; Seibert, M. M.; Shoeman, R. L.; Sierra, R. G.; Soltau, H.; Spence, J. C. H.; Stellato, F.; Stern, S.; Struder, L.; Ullrich, J.; Wang, X.; Weidenspointner, G.; Weierstall, U.; Wunderer, Cornelia; Chapman, H. N.
2012
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Title
Self-terminating diffraction gates femtosecond x-ray nanocrystallography measurements
Author
Barty, A.
Caleman, C.
Aquila, A.
Timneanu, N.
Lomb, L.
White, T. A.
Andreasson, J.
Arnlund, D.
Bajt, S.
Barends, T. R. M.
Barthelmess, M.
Bogan, M. J.
Bostedt, C.
Bozek, J. D.
Coffee, R.
Coppola, N.
Davidsson, J.
DePonte, Daniel
Doak, R. B.
Ekeberg, T.
Elser, V.
Epp, S. W.
Erk, B.
Fleckenstein, H.
Foucar, L.
Fromme, P.
Graafsma, H.
Gumprecht, L.
Hajdu, J.
Hampton, C. Y.
Hartmann, R.
Hartmann, A.
Hauser, G.
Hirsemann, H.
Holl, P.
Hunter, M. S.
Johansson, L.
Kassemeyer, S.
Kimmel, N.
Kirian, R. A.
Liang, M.
Maia, F. R. N. C.
Malmerberg, E.
Marchesini, S.
Martin, A. V.
Nass, K.
Neutze, R.
Reich, C.
Rolles, D.
Rudek, B.
Rudenko, A.
Scott, H.
Schlichting, I.
Schulz, Joachim
Seibert, M. M.
Shoeman, R. L.
Sierra, R. G.
Soltau, H.
Spence, J. C. H.
Stellato, F.
Stern, S.
Struder, L.
Ullrich, J.
Wang, X.
Weidenspointner, G.
Weierstall, U.
Wunderer, Cornelia
Chapman, H. N.
Caleman, C.
Aquila, A.
Timneanu, N.
Lomb, L.
White, T. A.
Andreasson, J.
Arnlund, D.
Bajt, S.
Barends, T. R. M.
Barthelmess, M.
Bogan, M. J.
Bostedt, C.
Bozek, J. D.
Coffee, R.
Coppola, N.
Davidsson, J.
DePonte, Daniel
Doak, R. B.
Ekeberg, T.
Elser, V.
Epp, S. W.
Erk, B.
Fleckenstein, H.
Foucar, L.
Fromme, P.
Graafsma, H.
Gumprecht, L.
Hajdu, J.
Hampton, C. Y.
Hartmann, R.
Hartmann, A.
Hauser, G.
Hirsemann, H.
Holl, P.
Hunter, M. S.
Johansson, L.
Kassemeyer, S.
Kimmel, N.
Kirian, R. A.
Liang, M.
Maia, F. R. N. C.
Malmerberg, E.
Marchesini, S.
Martin, A. V.
Nass, K.
Neutze, R.
Reich, C.
Rolles, D.
Rudek, B.
Rudenko, A.
Scott, H.
Schlichting, I.
Schulz, Joachim
Seibert, M. M.
Shoeman, R. L.
Sierra, R. G.
Soltau, H.
Spence, J. C. H.
Stellato, F.
Stern, S.
Struder, L.
Ullrich, J.
Wang, X.
Weidenspointner, G.
Weierstall, U.
Wunderer, Cornelia
Chapman, H. N.
Affiliation
EuXFEL staff
Author Group
Optical Lasers
Sample Environment
Advanced Electronics
Detector Development
Sample Environment
Advanced Electronics
Detector Development
Imprint
London [u.a.], 2012, Nature Publ. Group
Date
2012
Publication Information
Nat. Photonics, 6, 35-40 (2012)
ISSN
1749-4893
1749-4885
1749-4885
Related external records
WOS: WOS:000298416200013
DOI: https://doi.org/10.1038/nphoton.2011.297
DOI: https://doi.org/10.1038/nphoton.2011.297
Related proposal number
POF II
Content Type
Articles
Funding Information
Experiments at CFEL (POF2-544)
Record Appears in
Groups > Detectors and data acquisition > Electronic & Electrical Engineering
Groups > Scientific instruments and equipment > Sample Environment
Groups > Scientific instruments and equipment > Optical Lasers
Groups > Detectors and data acquisition > Detector Development
Types > Articles
Years > 2012
Advanced Electronics (AE)
Groups > Scientific instruments and equipment > Sample Environment
Groups > Scientific instruments and equipment > Optical Lasers
Groups > Detectors and data acquisition > Detector Development
Types > Articles
Years > 2012
Advanced Electronics (AE)