Record Details

Title:
Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography
Abstract:
In the past decade Kirkpatrick-Baez (KB) mirrors have been established as powerful focusing systems in hard X-ray microscopy applications. Here a ptychographic characterization of the KB focus in the dedicated nano-imaging setup GINIX (Göttingen Instrument for Nano-Imaging with X-rays) at the P10 coherence beamline of the PETRA III synchrotron at HASLYLAB/DESY, Germany, is reported. More specifically, it is shown how aberrations in the KB beam, caused by imperfections in the height profile of the focusing mirrors, can be eliminated using a pinhole as a spatial filter near the focal plane. A combination of different pinhole sizes and illumination conditions of the KB setup makes the prepared optical setup well suited not only for high-resolution ptychographic coherent X-ray diffractive imaging but also for moderate-resolution/large-field-of-view propagation imaging in the divergent KB beam.
Imprint:
Chester, IUCr, 2013
Journal Information:
J. Synchrotron Rad., 20, 490-497 (2013)
ISSN:
0909-0495
1600-5775
External related publications:
Language(s):
English
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 Record created 2016-10-11, last modified 2017-10-19


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