Record Details

Title:
A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution
Affiliation(s):
XFEL.EU staff, Other
Topic:
Scientific area:
Abstract:
We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments.
Imprint:
2018
Journal Information:
Review of Scientific Instruments, 89 (2), 023703 (2018)
External related publications:
Language(s):
English


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 Record created 2018-02-06, last modified 2018-03-20

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