Record Details

Title:
Start-to-end simulation of single-particle imaging using ultra-short pulses at the European X-ray Free-Electron Laser
Affiliation(s):
XFEL.EU staff, Other
Keyword(s):
Topic:
Scientific area:
Abstract:
Single-particle imaging with X-ray free-electron lasers (XFELs) has the potential to provide structural information at atomic resolution for non-crystalline biomolecules. This potential exists because ultra-short intense pulses can produce interpretable diffraction data notwithstanding radiation damage. This paper explores the impact of pulse duration on the interpretability of diffraction data using comprehensive and realistic simulations of an imaging experiment at the European X-ray Free-Electron Laser. It is found that the optimal pulse duration for molecules with a few thousand atoms at 5 keV lies between 3 and 9 fs.
Imprint:
2017
Journal Information:
International Union of Crystallography Journal, 4, 560-568 (2017)
External related publications:
Language(s):
English


Export


 Record created 2017-09-05, last modified 2018-05-03

Fulltext:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)